Analytical laboratory / Surface analysis / Scanning electron microscope (SEM)
Zeiss LEO 1560
CAPABILITY:
Resolution: 5nm at 0.2 kV and at 2mm WD
2.5nm at 1 kV and at 2mm WD
1.5nm at 10 kV and at 2mm WD
1nm at 20 kV and at 2mm WD
Magnification: 20X to 900 000X
Probe current:: 4pA to 10nA
Electron gun: Thermal field emission
Detectors: In-Lens: Annular type
External: E-T Type mounted in chamber
Robinson Backscattered Electron Detector
Accelerating Voltage: 200V to 30kV
Specimen Stage: Type: 6 axis fully Eucentric
Movements: X = 153mm
Y = 153mm
Z’ = 10mm
Z = 43mm
Tilt : -15˚to 65˚
Rotation : 360˚ continuous
Specimen Exchange Airlock Size : 210mm x 50mm
Specimen Chamber: Inside diameter: 520mm
Height:: 300mm
EDS Detector: Si(Li) (30mm2) Prism 2000 with Imix acquisition system allowing Be detection