CAPABILITY:

Manual probe station, for wafers and substrates, usable for a wide variety of applications such as I-V/C-V, RF, device characterization, failure analysis (FA), submicron probing and more. Its stable platen is designed to accommodate several positioners, providing a function similar to a probe card for special wafer-level reliability (WLR) applications.

Positioners

Several positioner models with vacuum or magnetic base, which can be used with high current probe tips or RF probes