Analytical laboratory / Surface analysis / Auger Electron spectroscopy (AES)
JEOL JSM 6400F
CAPABILITY:
Resolution: 1.5 nm at 30 kV and at 8mm WD
Magnification: 10X to 500 000X
Probe current:: 10-12 to 10-10 A
Electron gun: Cold-cathode field emission
Detectors: Scintillator/photomultiplier
GW Electronic System 47 backscattered detector
Accelerating Voltage: 500V to 30kV
Specimen Stage: Type: Fully Eucentric goniometer stage
Movements: X = 100mm
Y = 110mm
Z = 34mm
Tilt: -5˚to 60˚
Rotation: 360˚ endless
Specimen exchange: By airlock: Up to 150mm dia. Specimen holders
By stage drawout: 200mm dia. or larger specimen holders
EDS Detector: Si(Li) (30mm2) Prism 2000 with Imix acquisition system allowing Be detection
EBSD detector: Oxford HKL allowing crystallographic orientation