Electrical tests laboratory / Functionality tests / Electrical verification
Teradyne Ultraflex
CAPABILITY:
HSD1000 cards
800 Mbps, OTA: +/- 150ps, Pattern Mem: 256MB/pin,
scan option
UP1100 cards
1600 Mbps, OTA: +/- 100ps, Pattern Mem: 496MB/pin,
scan option, Hardware Source Synchronous, Protocol
Aware Option for many high speed buses (ex: DDR),
Memory Test Option
Capability:
UltraPin400 cards
4000 Mbps, OTA: +/- 35ps, Pattern Mem: 512MB/pin, scan option
SB6G cards
6.4 Gbps, Pattern Mem: 256MB/pin, PRBS Hardware, Receive Data-Lock, Jitter Injection, Real-Time Data Eye compliance
UltraSerial10G cards
10 Gbps, Pattern Mem: 256MB/pin, PRBS Hardware, Receive Data-Lock, Jitter Injection, Real-Time Data Eye compliance, Protocol Aware Option for many high speed buses (ex: DDR, PCIe 2.0)
UltraPac80 Mixed Signal Option
8 independent source and capture channels
source: 16/24 bit, 400 MHz, 32 Msample Mem, DC to 80MHz BW
capture: 16/24 bit, 75/30 MHz, 8 Msample Mem, DC to 75MHz BW
< 56ps channel to channel skew
Per Pin Measurement Unit & Time Measurement Unit
VHFAC Option
2 independent source and capture channels
source: 14 bit, 400 Msps, 8 Msample Mem, DC to 160MHz BW
capture: 12/14 bit, 125/80 Msps, 1 Msample Mem, DC to 62.5MHz BW
Per Pin Measurement Unit & Time Measurement Unit