CAPABILITY: X-ray column: Max Voltage 160 kV Max Current 600µA Sub-micron imaging resolution 3 focusing mode (nanoFocus, microFocus, High Power)

CAPABILITY: The 20W Model 2400 SourceMeter® instrument allows sourcing and measuring voltage from ±5µV (sourcing) and ±1µV (measuring) to ±200V

CAPABILITY: OHMS 9 ranges: 10 Ù to 1GÙ Two-wire and four-wire Ohms with offset compensation Up to 50,000 readings/sec (5.5

CAPABILITY: Time  Domain Reflectometry: 80E04 TDR Sampling Module (20Ghz) 80E10 TDR Sampling module (50GHz) Q-factor Extinction Ratio Signal-to-noise Ratio Wide

CAPABILITY: High Precision Measurements of Semiconductor Devices Up to 2000 Volts or 10 Amp Sourcing Up to 220 Watts 1

CAPABILITY:  Widest range of microwave applications Include active device characterization and tests Device modeling High-speed digital passive circuit Material research.

CAPABILITY: Test every form factor modules up to 55mm x 55mm Compatible with 0.8mm and 1mm BGA/LGA pitch Fully configurable

CAPABILITY: Manual probe station, for wafers and substrates, usable for a wide variety of applications such as I-V/C-V, RF, device

CAPABILITY: Time0.1% basic accuracy 100 Hz, 120 Hz, 1 kHz, 10 kHz, 100 kHz test frequencies 20 m to 1

CAPABILITY: The HP 4140B pA Meter/DC Voltage Source provides a stable picoampere meter with a maximum resolution of 10-15 A,